News Releases

Date Title and Summary
Toggle Summary KLA-Tencor Introduces Laser-Imaging Patterned Wafer Inspection System with High Sensitivity and Defect Capture for Advanced Devices
Combination of Oblique Angle Darkfield Illumination and Small Pixel Digital Image Processing Result in Optimal CMP Inspection Tool
Toggle Summary KLA-Tencor to Acquire Amray, Inc., a Leading Provider of SEM Defect Review Systems
KLA-Tencor to Acquire Amray, Inc., a Leading Provider of SEM Defect Review Systems San Jose, CA, March 16, 1998 - KLA-Tencor Corp. (Nasdaq: KLAC) today signed a definitive agreement to acquire AMRAY, Inc. (Bedford, Mass.), a privately-owned leading provider of scanning electron microscope (SEM)
Toggle Summary KLA-Tencor Appoints President of Taiwan Operations
KLA-Tencor Appoints President of Taiwan Operations San Jose, CA, March 11, 1998 - KLA-Tencor Corp. (Nasdaq:KLAC) today announced the appointment of Dr. Michael Chuang, 39, as president of KLA-Tencor Taiwan, the company's wholly-owned Taiwanese subsidiary.
Toggle Summary KLA-Tencor Expands Technology Portfolio Through Acquisition of Nanopro GMBH
KLA-Tencor Expands Technology Portfolio Through Acquisition of Nanopro GMBH San Jose, CA, February 18, 1998 - KLA-Tencor Corp. (Nasdaq:KLAC) today announced the acquisition of Nanopro GmbH (Freiburg, Germany), a privately-held company specializing in the development of advanced interferometric
Toggle Summary KLA-Tencor and Avant! Announce Agreement for Reticle Inspection Software Development
Avant! tools will provide critical link between reticle inspection data and analysis of photomask quality
Toggle Summary KLA-Tencor's SEM Technology for Critical Dimension Measurement and Advanced Defect Inspection Selected by Texas Instruments
8100XP and SEMSpec Systems to be Installed at New Advanced Process Development Center
Toggle Summary KLA-Tencor Reports Operating Results for Second Quarter