News Releases

Date Title and Summary
Toggle Summary KLA-Tencor to Acquire Amray, Inc., a Leading Provider of SEM Defect Review Systems
KLA-Tencor to Acquire Amray, Inc., a Leading Provider of SEM Defect Review Systems San Jose, CA, March 16, 1998 - KLA-Tencor Corp. (Nasdaq: KLAC) today signed a definitive agreement to acquire AMRAY, Inc. (Bedford, Mass.), a privately-owned leading provider of scanning electron microscope (SEM)
Toggle Summary KLA-Tencor Appoints President of Taiwan Operations
KLA-Tencor Appoints President of Taiwan Operations San Jose, CA, March 11, 1998 - KLA-Tencor Corp. (Nasdaq:KLAC) today announced the appointment of Dr. Michael Chuang, 39, as president of KLA-Tencor Taiwan, the company's wholly-owned Taiwanese subsidiary.
Toggle Summary KLA-Tencor Expands Technology Portfolio Through Acquisition of Nanopro GMBH
KLA-Tencor Expands Technology Portfolio Through Acquisition of Nanopro GMBH San Jose, CA, February 18, 1998 - KLA-Tencor Corp. (Nasdaq:KLAC) today announced the acquisition of Nanopro GmbH (Freiburg, Germany), a privately-held company specializing in the development of advanced interferometric
Toggle Summary KLA-Tencor and Avant! Announce Agreement for Reticle Inspection Software Development
Avant! tools will provide critical link between reticle inspection data and analysis of photomask quality
Toggle Summary KLA-Tencor's SEM Technology for Critical Dimension Measurement and Advanced Defect Inspection Selected by Texas Instruments
8100XP and SEMSpec Systems to be Installed at New Advanced Process Development Center
Toggle Summary KLA-Tencor Reports Operating Results for Second Quarter