Press Releases

All Releases
View Summary KLA-Tencor Introduces Overlay Metrology System for 0.13-Micron Design Rules
Jun 1, 1999
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View Summary KLA-Tencor Introduces Advanced Reticle Contamination Inspection System for DUV Lithography
Apr 16, 1999
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View Summary KLA-Tencor Reports Operating Results for Third Quarter
Apr 14, 1999
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View Summary KLA-Tencor's Advanced CD SEM Addresses New Metrology Challenges for Low k1 Photolithography
Mar 19, 1999
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View Summary KLA-Tencor First to Automate After-Develop Inspection for Macro Defects
Feb 16, 1999
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View Summary KLA-Tencor Reports Operating Results for Second Quarter
Jan 19, 1999
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View Summary KLA-Tencor Announces Continuation of Systematic Repurchase Plan for Shares of Common Stock
Jan 11, 1999
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View Summary KLA-Tencor Acquires Ultrapointe Business from Uniphase
Jan 7, 1999
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View Summary KLA-Tencor Is First in Industry to Achieve Level 2 in SEI's Software Capability Maturity Model
Jan 6, 1999
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View Summary KLA-Tencor Advances Production Capabilities With Answer! for HRP-220 High-Resolution Profiler
Jul 13, 1998
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View Summary KLA-Tencor Completes Acquisition of Amray, Inc.
Apr 7, 1998
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View Summary KLA-Tencor Anticipates Lower Third Quarter Results
Apr 1, 1998
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View Summary KLA-Tencor Extends Reticle Quality Management Through the Photolithography Process
Mar 19, 1998
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View Summary KLA-Tencor Introduces Laser-Imaging Patterned Wafer Inspection System with High Sensitivity and Defect Capture for Advanced Devices
Mar 18, 1998
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View Summary KLA-Tencor to Acquire Amray, Inc., a Leading Provider of SEM Defect Review Systems
Mar 16, 1998
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View Summary KLA-Tencor Appoints President of Taiwan Operations
Mar 11, 1998
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View Summary KLA-Tencor Expands Technology Portfolio Through Acquisition of Nanopro GMBH
Feb 18, 1998
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View Summary KLA-Tencor and Avant! Announce Agreement for Reticle Inspection Software Development
Feb 13, 1998
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View Summary KLA-Tencor's SEM Technology for Critical Dimension Measurement and Advanced Defect Inspection Selected by Texas Instruments
Jan 28, 1998
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View Summary KLA-Tencor Reports Operating Results for Second Quarter
Jan 20, 1998
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The materials contained on this website (including webcasts, presentations and press releases) contain certain forward-looking statements and are subject to the Safe Harbor provisions created by the Private Securities Litigation Reform Act of 1995. These forward-looking statements are based on current information and expectations as of the date of the applicable webcast, presentation or publication and involve a number of risks and uncertainties. Actual results may differ materially from those projected in such statements due to various factors, including but not limited to: changes in the demand for semiconductors; changes in anticipated orders by customers; the timing of shipments or acceptances; macroeconomic conditions; and new and enhanced product offerings by competitors. For other factors that may cause actual results to differ from those projected, please refer to the KLA-Tencor's most recent Annual Report on Form 10-K, Quarterly Reports on Form 10-Q and other filings with the United States Securities and Exchange Commission.

 
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